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Triangular Test Grating for X- or Y-axis Select:Test grating TGT-1500, 3µm pitch, unmounted Material Code Copper C Nickel

SKU: 3889577679

4.0
EUR200.45 EUR243.45

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Ships within 48 hours · Estimated delivery Aug 1 - Aug 6

Description

Material Code Copper C Nickel N Gold G Aluminum A Molybdenum M Titanium T Stainless Steel S

Gold substrate layer thickness: 50nm (±5nm)

Transmission 74%

(We recommend the use of a “D-type” 3-ring binder for best results)

Triangular Test Grating for X- or Y-axis Select:Test grating TGT-1500, 3µm pitch, unmounted Material Code Copper C NickelDESCRIPTION The TGT 1500 test grating is intended for SPM calibration in X or Y axis, determination of lateral and vertical scanner nonlinearity, detection of angular distortion and tip characterization. Nominal values for height and pitch are given below. Actual values come with the test grating. Structure: Si wafer with grating in top surface Pattern type: 1 D array of triangular steps with precise linear and angular dimensions Edge angle:

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